With over 20 years of experience in high-tech applications, we specialize in delivering cutting-edge solutions across a wide range of domains
Accelerating time to market with scalable wireless solutions and parametric testing automation.
Simultaneous wireless measurements at scale with large-scale data post processing
Delivering to SW teams in Europe, China and North America
Parametric testing for any wireless standard, any manufacturer, any product
Expert Solutions for Advanced Wireless Communication & Testing
Oriel brings extensive experience in developing cutting-edge communication solutions for mobile, space, and military applications. Our expertise includes:
Scalable, Secure, and Smart Testing—Powering Innovation with Real-Time Insights.
Our cutting-edge systems support product development teams across Europe, China, and North America, ensuring seamless collaboration and efficiency.
Seamless CI/CD Automation – Smarter Testing, Faster Delivery, Lower Costs.
Oriel provides cutting-edge automated parametric test systems designed for connected (wireless) applications, streamlining the entire testing process.
High-quality, next-generation scalable solutions designed to meet the demands of your business.
Ensuring the software operates as expected, meeting requirements with optimal response time, throughput, and resource efficiency.
Designed to run smoothly under normal and peak conditions, minimizing crashes and unexpected failures while maintaining data integrity during upgrades or downgrades.
Protecting against unauthorized access, malicious attacks, and data breaches to ensure user trust and regulatory compliance.
Providing an intuitive, efficient, and user-friendly interface while ensuring seamless operation across various platforms, browsers, and devices.
Built to handle growth effortlessly and manage unexpected errors or failures gracefully, maintaining high availability and resilience.
Designed for easy modifications, updates, and enhancements to address evolving business needs, performance improvements, and issue resolution.